Certified Welding Inspectors are ready to assist in your weld consultation. No matter where you are in your process, our professionals are here to assist you in your process for developing a welding program or process that will meet the applicable welding code. We can travel to your location and sign off on Welding Specification Procedure (WPS), watch welders, sign off on Procedure Qualification Record (PQR), as well as inspect any welds you have already made. Call us today with any questions you may have.
Certified Welding Inspectors are ready to assist in your weld consultation. No matter where you are in your process, our professionals are here to assist you in your process for developing a welding program or process that will meet the applicable welding code. We can travel to your location and sign off on Welding Specification Procedure (WPS), watch welders, sign off on Procedure Qualification Record (PQR), as well as inspect any welds you have already made. Call us today with any questions you may have.
Phone: 303-780-9800
Scanning Electron Microscope
A scanning electron microscope (SEM) is an analytical instrument that uses an electron beam to scan over an area of a specimen’s surface and produces an image from electron-electron surface interactions. SEM images can be produced from two types of electron sources: (1) secondary or (2) back-scattered electrons. Secondary electron (SE) imaging allows for the characterization of a specimen’s topographical features due to the large depth of field and high magnifications (up to 200,000X) associated with an SEM. Back-scattered electron (BSE) imaging allows for characterization of a specimen’s elemental composition as the intensity of a BSE image is strongly dependent on to the atomic number (Z) of the area under analyzed; BSE imaging allows for identification of elemental changes at the surface of geological, metal, plastic, and ceramic specimens. The interaction volume (IV) from a specimen’s surface that produces the different signals that can be created and detected by an SEM (such as SE, BSE, and characteristic X-rays) is approximately 1 cubic micrometer in size; as a result, scanning electron microscopy is considered a surface analysis technique.
